Access to Advanced Facilities and Renowned Experts
Multiple facilities. Multiple solutions. One source: Vaeros.
For more than five decades, The Aerospace Corporation has provided objective technical expertise, analysis, and assessments for global customers pursuing the most complex, innovative, and important missions.
Vaeros, a division of The Aerospace Corporation, brings this rich resource of talent and technical capabilities to bear on multiple challenges in diverse, high-consequence environments.
By making a wide range of facilities and testing services available to customers, we are enabling 100-percent mission success across multiple industries, applications, and programs of national significance.
World-class capabilities. Best-in-class results.
Vaeros provides access to world-class experts and state-of-the-art facilities to assist in establishing the root cause of parts and materials failures—with a particular focus on microelectronic and optoelectronic components, and evaluation of the construction and quality of integrated circuits.
Working together with customers across multiple industries, Vaeros helps reduce risk, improve efficiency, and reduce program costs in applications where high reliability and high stakes are key.
In addition, Vaeros provides tailored services that leverage capabilities developed for the most demanding operating environments. Capabilities of this caliber, developed with only mission success in mind, are not readily available elsewhere.
Facilities and testing services.
Vaeros offers a number of facilities and testing services:
Inertial Sensor – Electromechanical Control Facility
Our dynamics and controls center engineers and technicians have extensive experience with component subsystem-level test and experimentation, as well as in the evaluation of electromechanical devices (including electro-optical and opto-mechanical devices) and subsystems.
Our laboratory facilities include a custom thermal vacuum chamber, as well as a two-axis rate table that can subject a test unit to an input rate in both azimuth and elevation simultaneously. Our six-degrees-of-freedom “Dynapod” can impart repeatable, flight-like, low-level vibration into a test unit, and can also be used as a dynamometer to measure exported forces and torques of the unit under test.
Computerized Tomography (CT) Scans
Much like medical CAT scans, Vaeros’s scanning technique produces 3-D images of an object in astounding detail. Of course, the equipment alone does not make a lab stand out—the skill of attending scientists makes all the difference in the quality of the CT image.
Electrical Impedance Spectroscopy (EIS) System
EIS is a technique in which a small AC signal is applied to a material and the measured impedance is used to deduce important properties or states of the material.
While the technique itself is not new, its sensitivity and simplicity relative to other methods, as well as its cost-effectiveness, are making it a highly desirable and practical procedure across more and more applications than ever before.
Microelectronics Failure Analysis and Quality Assessment Facility
The Failure Analysis and Quality Assessment Facility is used to assist in establishing the root cause of failures in microelectronic and optoelectronic components and to evaluate the construction quality of integrated circuits.
The facility includes several advanced pieces of analytical equipment, including three dual-beam focused ion beam systems, for evaluation of integrated circuits or microscale/nanoscale editing of circuits, as well as for preparation of 3-D views of advanced structures at the nanoscale.
Three realtime x-ray analysis systems with CT capabilities are used to inspect assembled components inside sealed systems, and to develop 3-D views by CT reconstruction. A time-of-flight secondary ion mass spectrometer is used for surface analysis for contamination investigations. High-resolution scanning electron microscopes and atomic force microscopes are used for detailed inspection of surface and subsurface features of circuit components. A transmission electron microscope and a high-resolution transmission electron microscope are used for imaging and chemical analysis at the atomic scale.
The facility also includes scribing, etching, and polishing equipment for sectioning and layer removal, semiconductor test equipment, and optical microscopes for visual inspection.
Parts, Materials, and Processes Test and Evaluation Facility
The Parts, Materials, and Processes Test and Evaluation Facility performs assessment of launch and space vehicle electronics and materials from the component (piece part) through circuit board levels of assembly.
Engineering functions performed in the facility include destructive physical analysis, failure analysis and anomaly resolution, investigation of quality or reliability concerns, the evaluation of new electronic devices under consideration for use in space, and development of advanced laboratory evaluation techniques.
The facility has many unique capabilities and is fully equipped to perform tests and analyses on electronic piece parts and materials consistent with the most stringent military standards and commercial requirements. The facility includes test and inspection equipment to perform optical and scanning electron, infrared, and acoustic microscopy, cross-sectioning, plastic device decapsulation, environmental and reliability test, passive and semiconductor device test, mechanical test, and realtime x-radiography.
Get additional information and insight.
The extensive facilities and deep technical expertise at Vaeros are helping customers across a wide range of programs and applications, while reducing costs and increasing speed-to-market.
Contact Vaeros today to learn how we can help enable your success.